IEEE - Institute of Electrical and Electronics Engineers, Inc. - Every test makes a difference: Compressing analog tests to decrease production costs

2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC)

Author(s): Seyed Nematollah Ahmadyan ; Suriyaprakash Natarajan ; Shobha Vasudevan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2016
Conference Location: Macau, China
Conference Date: 25 January 2016
Page(s): 539 - 544
ISBN (CD): 978-1-4673-9568-7
ISBN (Electronic): 978-1-4673-9569-4
ISSN (Electronic): 2153-697X
DOI: 10.1109/ASPDAC.2016.7428067
Regular:

We introduce a methodology for automated test compression during electrical stress testing of analog and mixed signal circuits. This methodology optimally extracts only portions of a functional... View More

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