IEEE - Institute of Electrical and Electronics Engineers, Inc. - Multi-version checkpointing for flash file systems

2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC)

Author(s): Shih-Chun Chou ; Yuan-Hao Chang ; Yuan-Hung Kua ; Po-Chun Huang ; Che-Wei Tsao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2016
Conference Location: Macau, China
Conference Date: 25 January 2016
Page(s): 436 - 443
ISBN (CD): 978-1-4673-9568-7
ISBN (Electronic): 978-1-4673-9569-4
ISSN (Electronic): 2153-697X
DOI: 10.1109/ASPDAC.2016.7428051
Regular:

Reliability has become a critical design issue in flash storage systems, because of the adoption of the low-cost, high-error-rate flash chips to fulfill the needs of the fast-growing storage... View More

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