IEEE - Institute of Electrical and Electronics Engineers, Inc. - On-chip monitoring and compensation scheme with fine-grain body biasing for robust and energy-efficient operations

2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC)

Author(s): A. K. M. Mahfuzul Islam ; Hidetoshi Onodera
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2016
Conference Location: Macau, China
Conference Date: 25 January 2016
Page(s): 403 - 409
ISBN (CD): 978-1-4673-9568-7
ISBN (Electronic): 978-1-4673-9569-4
ISSN (Electronic): 2153-697X
DOI: 10.1109/ASPDAC.2016.7428045
Regular:

Aggressive technology scaling and strong demand for lowering supply voltage impose a serious challenge in achieving robust and energy-efficient circuit operation. This paper first overviews on... View More

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