IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fast prime generation algorithms using proposed GCD test on mobile smart devices

2016 International Conference on Big Data and Smart Computing (BigComp)

Author(s): Hosung Jo ; Heejin Park
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2016
Conference Location: Hong Kong, China
Conference Date: 18 January 2016
Page(s): 374 - 377
ISBN (Electronic): 978-1-4673-8796-5
ISBN (USB): 978-1-4673-8795-8
ISSN (Electronic): 2375-9356
DOI: 10.1109/BIGCOMP.2016.7425951
Regular:

As mobile smart devices are widely used, mobile security becomes more and more important. However, the performance of these devices are not powerful enough to use the same security algorithms as... View More

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