IEEE - Institute of Electrical and Electronics Engineers, Inc. - Mapping of machine faults using tools of World Class Manufacturing

2016 IEEE 14th International Symposium on Applied Machine Intelligence and Informatics (SAMI)

Author(s): A. Novicka ; P. Papcun ; I. Zolotova
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2016
Conference Location: Herlany, Slovakia
Conference Date: 21 January 2016
Page(s): 223 - 227
ISBN (Electronic): 978-1-4673-8740-8
ISBN (USB): 978-1-4673-8739-2
DOI: 10.1109/SAMI.2016.7423011
Regular:

The article deals with the description of the principles of World Class Manufacturing, the pillars, techniques, procedure of implementation and PDCA cycle definition. In the case study of Fiat... View More

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