IEEE - Institute of Electrical and Electronics Engineers, Inc. - An angle-selective CMOS imager with on-chip micro-collimators for blur reduction in near-field cell imaging

2016 IEEE 29th International Conference on Micro-Electro-Mechanical Systems (MEMS)

Author(s): Efthymios P. Papageorgiou ; Bernhard E. Boser ; Mekhail Anwar
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2016
Conference Location: Shanghai, China
Conference Date: 24 January 2016
Page(s): 337 - 340
ISBN (Electronic): 978-1-5090-1973-1
ISBN (USB): 978-1-5090-1972-4
DOI: 10.1109/MEMSYS.2016.7421629
Regular:

Development of microfabricated imagers placed within the resection bed intraoperatively can significantly improve image-guided surgery. One application is identifying microscopic disease during... View More

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