IEEE - Institute of Electrical and Electronics Engineers, Inc. - The Visualization Study on Expert Selection in Peer-Review Based on Knowledge Mapping

2009 1st International Conference on Information Science and Engineering (ICISE)

Author(s): Ying He
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2009
Conference Location: Nanjing, China, China
Conference Date: 26 December 2009
Page(s): 3,544 - 3,547
ISBN (CD): 978-0-7695-3887-7
ISBN (Electronic): 978-1-4244-5728-1
ISBN (Paper): 978-1-4244-4909-5
DOI: 10.1109/ICISE.2009.1306
Regular:

The article describes a method that can solve the selection problem of peer review experts - Scientometrics. From the external part of the scientific community, we can deal with the expert... View More

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