IEEE - Institute of Electrical and Electronics Engineers, Inc. - Study on the Damage Identification of Long-Span Arch Bridge Based on Variation Ratio of Curvature and RBF Neural Network

2009 1st International Conference on Information Science and Engineering (ICISE)

Author(s): Liu Chun-Cheng ; Liu Jiao ; Sun Xiang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2009
Conference Location: Nanjing, China, China
Conference Date: 26 December 2009
Page(s): 4,534 - 4,537
ISBN (CD): 978-0-7695-3887-7
ISBN (Electronic): 978-1-4244-5728-1
ISBN (Paper): 978-1-4244-4909-5
DOI: 10.1109/ICISE.2009.1135
Regular:

Half-through arch bridge is an important traffic structure, so it is extremely valuable to study the damage location questions on the condition of suspender damage. Based on the finite element... View More

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