IEEE - Institute of Electrical and Electronics Engineers, Inc. - Research on Applied Diagnosis Technology Based on Reconstruction

2009 1st International Conference on Information Science and Engineering (ICISE)

Author(s): Li Wei
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2009
Conference Location: Nanjing, China, China
Conference Date: 26 December 2009
Page(s): 3,831 - 3,834
ISBN (CD): 978-0-7695-3887-7
ISBN (Electronic): 978-1-4244-5728-1
ISBN (Paper): 978-1-4244-4909-5
DOI: 10.1109/ICISE.2009.937
Regular:

The technology of an intelligent fault diagnosis provides a new way for the reliability and safety of industrial systems, but, it can gradually no longer meet all demand to diagnose faults in... View More

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