IEEE - Institute of Electrical and Electronics Engineers, Inc. - The Study of the Relationship between Organizational Justice and Job Satisfaction on Y-Generation in Chinese IT Industry

2009 1st International Conference on Information Science and Engineering (ICISE)

Author(s): Weidan Xu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2009
Conference Location: Nanjing, China, China
Conference Date: 26 December 2009
Page(s): 4,601 - 4,604
ISBN (CD): 978-0-7695-3887-7
ISBN (Electronic): 978-1-4244-5728-1
ISBN (Paper): 978-1-4244-4909-5
DOI: 10.1109/ICISE.2009.1297
Regular:

Research on job satisfaction of employees has always been a hot spot in Human Resource Management. This study examined the relationship between three forms of organizational justice and job... View More

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