IEEE - Institute of Electrical and Electronics Engineers, Inc. - Progress and validation of Geant4 based radioactive decay simulation using the examples of Simbol-X and IXO

2009 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC 2009)

Author(s): S. Hauf ; M. Kuster ; M.G. Pia ; Z. Bell ; U. Briel ; R. Chipaux ; D.H.H. Hoffmann ; E. Kendziorra ; P. Laurent ; L. Struder ; C. Tenzer ; G. Weidenspointner ; A. Zoglauer
Sponsor(s): Nucl. Plasma Sci. Soc. Inst. Electr. Electron. Eng.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2009
Conference Location: Orlando, FL, USA
Conference Date: 24 October 2009
Page(s): 2,060 - 2,065
ISBN (CD): 978-1-4244-3962-1
ISBN (Paper): 978-1-4244-3961-4
ISSN (CD): 1082-3654
ISSN (Paper): 1082-3654
DOI: 10.1109/NSSMIC.2009.5402112
Regular:

The anticipated high sensitivity and the science goals of the next generation X-ray space missions, like the International X-ray Observatory or Simbol-X, rely on a low instrumental background,... View More

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