IEEE - Institute of Electrical and Electronics Engineers, Inc. - Early Software Fault Prediction Using Real Time Defect Data

2009 Second International Conference on Machine Vision (ICMV)

Author(s): Kaur, A. ; Sandhu, P.S. ; Bra, A.S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2009
Conference Location: Dubai, UAE, UAE
Conference Date: 28 December 2009
Page(s): 242 - 245
ISBN (Electronic): 978-1-4244-5645-1
ISBN (Paper): 978-0-7695-3944-7
DOI: 10.1109/ICMV.2009.54
Regular:

Quality of a software component can be measured in terms of fault proneness of data. Quality estimations are made using fault proneness data available from previously developed similar type of... View More

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