IEEE - Institute of Electrical and Electronics Engineers, Inc. - Study on the Management Maturity Model of High-Tech Venturing Project Based on Fuzzy Comprehensive Evaluation

2009 Second International Conference on Future Information Technology and Management Engineering (FITME)

Author(s): Xu Yang ; Xingyuan Wang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2009
Conference Location: Sanya, China, China
Conference Date: 13 December 2009
Page(s): 486 - 489
ISBN (Paper): 978-1-4244-5339-9
DOI: 10.1109/FITME.2009.127
Regular:

Using project management maturity model for reference and combining the three characteristics of high-tech venturing project- high input, high risks, and high returns- we analyze the factor of... View More

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