IEEE - Institute of Electrical and Electronics Engineers, Inc. - Summary Research of Risk Identification in the Process of Knowledge Management

2009 Second International Conference on Future Information Technology and Management Engineering (FITME)

Author(s): Yang Tong
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2009
Conference Location: Sanya, China, China
Conference Date: 13 December 2009
Page(s): 210 - 213
ISBN (Paper): 978-1-4244-5339-9
DOI: 10.1109/FITME.2009.58
Regular:

This paper classifies and concludes the risks existed in knowledge management from a view of identification. It has been divided into two aspects of knowledge assets at risk: the risk of knowledge... View More

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