IEEE - Institute of Electrical and Electronics Engineers, Inc. - On the Coverage of Program Code by Specification-Based Tests

2009 9th International Conference on Quality Software (QSIC)

Author(s): Yu, Y.T. ; Chan, E.Y.K. ; Poon, P.-L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2009
Conference Location: Jeju, Korea (South), Korea (South)
Conference Date: 24 August 2009
Page(s): 41 - 50
ISBN (CD): 978-0-7695-3828-0
ISBN (Electronic): 978-1-4244-5913-1
ISBN (Paper): 978-1-4244-5912-4
ISSN (Paper): 1550-6002
DOI: 10.1109/QSIC.2009.14
Regular:

Generating test cases from the specification can be done early in the software development life cycle. A test suite systematically generated from the software specification can be comprehensive in... View More

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