IEEE - Institute of Electrical and Electronics Engineers, Inc. - Towards Scalable Compositional Test Generation

2009 9th International Conference on Quality Software (QSIC)

Author(s): Tao Sun ; Zheng Wang ; Geguang Pu ; Xiao Yu ; Zongyan Qiu ; Bin Gu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2009
Conference Location: Jeju, Korea (South), Korea (South)
Conference Date: 24 August 2009
Page(s): 353 - 358
ISBN (CD): 978-0-7695-3828-0
ISBN (Electronic): 978-1-4244-5913-1
ISBN (Paper): 978-1-4244-5912-4
ISSN (Paper): 1550-6002
DOI: 10.1109/QSIC.2009.53
Regular:

One difficulty of automated test case generation is to deal with compositional units that brings in compositional space explosion of program states. We present a new dynamic execution framework... View More

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