IEEE - Institute of Electrical and Electronics Engineers, Inc. - Empirical Analysis on the Effect of Customer Relationship Management to the Customer Loyalty

2009 International Conference on Wireless Networks and Information Systems (WNIS)

Author(s): Hongfei Sun ; Min Liu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2009
Conference Location: Shanghai, China, China
Conference Date: 28 December 2009
Page(s): 147 - 149
ISBN (Electronic): 978-1-4244-5400-6
ISBN (Paper): 978-0-7695-3901-0
DOI: 10.1109/WNIS.2009.62
Regular:

A customer win-back model is developed to test the relationship among customer relationship management, commitment, and customer loyalty in this paper. This model involves customer relationship... View More

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