IEEE - Institute of Electrical and Electronics Engineers, Inc. - An active TAN classifier based on vote entropy-maximum entropy of QBC

2009 IEEE International Conference on Control and Automation (ICCA)

Author(s): Zhao, Y. ; Cao, Y.C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2009
Conference Location: Christchurch, New Zealand, New Zealand
Conference Date: 9 December 2009
Page(s): 1,587 - 1,590
ISBN (CD): 978-1-4244-4707-7
ISBN (Paper): 978-1-4244-4706-0
DOI: 10.1109/ICCA.2009.5410440
Regular:

Tree-Augmented Naïve Bayes (TAN) is a state-of-the-art extension of the naive Bayes, which outperforms naive Bayes, yet at the same time maintains the computational simplicity and robustness that... View More

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