IEEE - Institute of Electrical and Electronics Engineers, Inc. - A layer-based approach to build up diagnosis applications in process industries

2009 IEEE International Conference on Control and Automation (ICCA)

Author(s): Mertens, M. ; Epple, U.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2009
Conference Location: Christchurch, New Zealand, New Zealand
Conference Date: 9 December 2009
Page(s): 1,229 - 1,234
ISBN (CD): 978-1-4244-4707-7
ISBN (Paper): 978-1-4244-4706-0
DOI: 10.1109/ICCA.2009.5410187
Regular:

We present a generic approach in the form of a layer-based framework for building up applications that perform diagnosis or asset management functions. This framework is designed to run fully... View More

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