IEEE - Institute of Electrical and Electronics Engineers, Inc. - Leakage current quenching and lifetime enhancement in 3D pillar structured silicon PIN diodes

2009 International Semiconductor Device Research Symposium (ISDRS)

Author(s): Shao, Q. ; Conway, A.M. ; Voss, L.F. ; Heineck, D.P. ; Reinhardt, C.E. ; Graff, R.T. ; Nikolic, R.J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2009
Conference Location: College Park, MD, USA, USA
Conference Date: 9 December 2009
Page(s): 1 - 2
ISBN (CD): 978-1-4244-6031-1
ISBN (Paper): 978-1-4244-6030-4
DOI: 10.1109/ISDRS.2009.5378343
Regular:

Structures containing three dimensional (3D) pillars, wires and tubes have applications in sensors, photodetectors as well as solar cells. We have been developing a thermal neutron detector by... View More

Advertisement