IEEE - Institute of Electrical and Electronics Engineers, Inc. - Investigation of drift dynamics and injection stability of high-current electron beam with picosecond resolution

2009 IEEE Pulsed Power Conference (PPC)

Author(s): Yalandin, M.I. ; Reutova, A.G. ; Sharypov, K.A. ; Shpak, V.G. ; Shunailov, S.A. ; Ul'masculov, M.R. ; Mesyats, G.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2009
Conference Location: Washington, DC, USA, USA
Conference Date: 28 June 2009
Page(s): 971 - 974
ISBN (CD): 978-1-4244-4065-8
ISBN (Paper): 978-1-4244-4064-1
DOI: 10.1109/PPC.2009.5386144
Regular:

The stability of the injection of short electron beams and the dynamic processes that occur during their transport were experimentally studied. Beams of energy 200-300 keV, current 1-1500 A, and... View More

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