IEEE - Institute of Electrical and Electronics Engineers, Inc. - System identifiability for sparse and nonuniform samples via spectral analysis

2009 IEEE Youth Conference on Information, Computing and Telecommunication (YC-ICT)

Author(s): Boyi Ni ; Deyun Xiao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2009
Conference Location: Beijing, China, China
Conference Date: 20 September 2009
Page(s): 94 - 97
ISBN (CD): 978-1-4244-5076-3
ISBN (Paper): 978-1-4244-5074-9
DOI: 10.1109/YCICT.2009.5382418
Regular:

The system identifiability for sparse and nonuniform measurements is addressed. For uniformly sampled data, spectral information is only available below the Nyquist rate. Hence, it is not... View More

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