IEEE - Institute of Electrical and Electronics Engineers, Inc. - Application-aware generation and optimization for NoC topology

2009 IEEE Youth Conference on Information, Computing and Telecommunication (YC-ICT)

Author(s): Liu Zheng ; Cai Jueping ; Yao Lei ; Du Ming
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2009
Conference Location: Beijing, China, China
Conference Date: 20 September 2009
Page(s): 259 - 262
ISBN (CD): 978-1-4244-5076-3
ISBN (Paper): 978-1-4244-5074-9
DOI: 10.1109/YCICT.2009.5382375
Regular:

In this paper, we present a methodology for modeling, analysis and generation of NoC topology. Specially, our optimization framework of static and dynamic properties ensures core-to-core... View More

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