IEEE - Institute of Electrical and Electronics Engineers, Inc. - Robust features extraction for lap welding seam tracking system

2009 IEEE Youth Conference on Information, Computing and Telecommunication (YC-ICT)

Author(s): Chunlan Gu ; Yuan Li ; Qinglin Wang ; De Xu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2009
Conference Location: Beijing, China, China
Conference Date: 20 September 2009
Page(s): 319 - 322
ISBN (CD): 978-1-4244-5076-3
ISBN (Paper): 978-1-4244-5074-9
DOI: 10.1109/YCICT.2009.5382359
Regular:

A robust method is presented for features extraction based on structured light images of lap weld Joint. On the basis of image processing such as smoothing, adaptive thresholding and thinning, two... View More

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