IEEE - Institute of Electrical and Electronics Engineers, Inc. - Low DPM: Why Do We Need it and What Does it Cost!
2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT)
|Publisher:||IEEE - Institute of Electrical and Electronics Engineers, Inc.|
|Publication Date:||1 October 2009|
|Conference Location:||Chicago, Illinois, USA, USA|
|Conference Date:||7 October 2009|