IEEE - Institute of Electrical and Electronics Engineers, Inc. - Challenges in Delay Testing of Integrated Circuits

2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT)

Author(s): Walker, D.M.H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2009
Conference Location: Chicago, Illinois, USA, USA
Conference Date: 7 October 2009
Page(s): 81 - 82
ISBN (Paper): 978-0-7695-3839-6
ISSN (Paper): 1550-5774
DOI: 10.1109/DFT.2009.53
Regular:

Delay testing of integrated circuits is increasingly focused on detecting small delay defects, and improving correlation to functional test. In this talk we will describe our recent efforts and... View More

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