IEEE - Institute of Electrical and Electronics Engineers, Inc. - SNR-Aware Error Detection for Low-Power Discrete Wavelet Lifting Transform in JPEG 2000

2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT)

Author(s): Shih-Hsin Hu ; Tung-Yeh Wu ; Abraham, J.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2009
Conference Location: Chicago, Illinois, USA, USA
Conference Date: 7 October 2009
Page(s): 136 - 144
ISBN (Paper): 978-0-7695-3839-6
ISSN (Paper): 1550-5774
DOI: 10.1109/DFT.2009.17
Regular:

This paper presents a SNR-aware error detection technique for a low-power wavelet lifting transform architecture in JPEG 2000. Power reduction is done by over-scaling the supply voltage... View More

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