IEEE - Institute of Electrical and Electronics Engineers, Inc. - Improving Memory Repair by Selective Row Partitioning

2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT)

Author(s): Rab, M.T. ; Bawa, A.A. ; Touba, N.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2009
Conference Location: Chicago, Illinois, USA, USA
Conference Date: 7 October 2009
Page(s): 211 - 219
ISBN (Paper): 978-0-7695-3839-6
ISSN (Paper): 1550-5774
DOI: 10.1109/DFT.2009.20
Regular:

A new methodology for improving memory repair is presented which can be applied in either manufacture time repair or built-in self-repair (BISR) scenarios. In traditional memory repair, one spare... View More

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