IEEE - Institute of Electrical and Electronics Engineers, Inc. - Resilience Challenges for Exascale Systems

2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT)

Author(s): Jouppi, N.P.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2009
Conference Location: Chicago, Illinois, USA, USA
Conference Date: 7 October 2009
Page(s): 379
ISBN (Paper): 978-0-7695-3839-6
ISSN (Paper): 1550-5774
DOI: 10.1109/DFT.2009.52
Regular:

The combination of decreasing device reliability due to deep submicron scaling, increasing integration, and the size of future exascale high-performance computers and cloud datacenters pose... View More

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