IEEE - Institute of Electrical and Electronics Engineers, Inc. - Temperature dependence of inception of electrical tree from water-tree degradation

2009 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)

Author(s): Hayashi, Y. ; Suzuoki, Y. ; Kato, T. ; Komori, F. ; Mashima, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2009
Conference Location: Virginia Beach, VA, USA, USA
Conference Date: 18 October 2009
Page(s): 498 - 501
ISBN (CD): 978-1-4244-4559-2
ISBN (Paper): 978-1-4244-4557-8
ISSN (Paper): 0084-9162
DOI: 10.1109/CEIDP.2009.5377732
Regular:

In order to clarify the mechanism of electrical-tree inception from water-tree degradation which often determines the remaining life of power cables, we have been investigating electrical tree... View More

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