IEEE - Institute of Electrical and Electronics Engineers, Inc. - EVM measurement techniques for MUOS

MILCOM 2009 - 2009 IEEE Military Communications Conference

Author(s): Wang, A.K. ; McAllister, A.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2009
Conference Location: Boston, MA, USA, USA
Conference Date: 18 October 2009
Page(s): 1 - 7
ISBN (CD): 978-1-4244-5239-2
ISBN (Paper): 978-1-4244-5238-5
DOI: 10.1109/MILCOM.2009.5379776
Regular:

Physical layer simulations and analysis techniques were used to develop the Error Vector Magnitude (EVM) metric specifying transmitter signal quality. These tools also proved to be very useful in... View More

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