IEEE - Institute of Electrical and Electronics Engineers, Inc. - Synergistic-ANN Recognizers for Monitoring and Diagnosis of Multivariate Process Shift Patterns

2009 International Conference of Soft Computing and Pattern Recognition (SOCPAR)

Author(s): Masood, I. ; Hassan, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2009
Conference Location: Malacca, Malaysia, Malaysia
Conference Date: 4 December 2009
Page(s): 266 - 271
ISBN (CD): 978-0-7695-3879-2
ISBN (Paper): 978-1-4244-5330-6
DOI: 10.1109/SoCPaR.2009.61
Regular:

An intelligent control chart pattern recognition system is essential for efficient monitoring and diagnosis process variation in automated manufacturing environment. Artificial neural networks... View More

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