IEEE - Institute of Electrical and Electronics Engineers, Inc. - Map Similarity Testing Using Matrix Decomposition

2009 International Conference on Intelligent Networking and Collaborative Systems (INCOS)

Author(s): Dvorsky, J. ; Snasel, V. ; Vozenilek, V.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Barcelona, Spain, Spain
Conference Date: 4 November 2009
Page(s): 290 - 294
ISBN (CD): 978-0-7695-3858-7
ISBN (Paper): 978-1-4244-5165-4
DOI: 10.1109/INCOS.2009.74
Regular:

The similarity of two maps can be most easily compared visually. In this case, the degree of similarity is very subjective. It is therefore necessary to find an objective method for measuring... View More

Advertisement