IEEE - Institute of Electrical and Electronics Engineers, Inc. - Study of Recognition Approach for Specific Sample Points in High Dimension Space

2009 Third International Symposium on Intelligent Information Technology Application (IITA)

Author(s): Gao Yarong ; Guo Jianxiao ; Wang Hongli ; Chi Xianglan ; Zhang Yushu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: NanChang, China, China
Conference Date: 21 November 2009
Volume: 3
Page(s): 259 - 262
ISBN (Paper): 978-0-7695-3859-4
DOI: 10.1109/IITA.2009.248
Regular:

Based on secondary analysis techniques to identify specific sample point using partial least-squares analysis method, the recognition method of specific sample point of two-dimensional floor plan... View More

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