IEEE - Institute of Electrical and Electronics Engineers, Inc. - A New Algorithm for Fabric Defect Detection Based on Image Distance Difference

2009 Third International Symposium on Intelligent Information Technology Application (IITA)

Author(s): Jingmiao Zhang ; Linru Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: NanChang, China, China
Conference Date: 21 November 2009
Volume: 2
Page(s): 217 - 219
ISBN (Paper): 978-0-7695-3859-4
DOI: 10.1109/IITA.2009.192
Regular:

This paper brings forward a new method of detection of fabric defect, namely image distance difference arithmetic. The system permit user to set appropriate control parameter of fabric defect... View More

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