IEEE - Institute of Electrical and Electronics Engineers, Inc. - Simulation of Fault Tolerance Based on Game-Theoretic Methodologies and Lossless Algorithm

2009 Third International Symposium on Intelligent Information Technology Application (IITA)

Author(s): Wang Yude
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: NanChang, China, China
Conference Date: 21 November 2009
Volume: 1
Page(s): 11 - 14
ISBN (Paper): 978-0-7695-3859-4
DOI: 10.1109/IITA.2009.78
Regular:

Linear-time configurations and RAID have garnered great interest from both analysts and theorists in the last several years. Given the current status of pseudorandom models, cyberneticists... View More

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