IEEE - Institute of Electrical and Electronics Engineers, Inc. - Decoupling Binary-Level Dynamic Test Generation from Specific Architecture Details

2009 Fourth International Conference on Computer Sciences and Convergence Information Technology (ICCIT)

Author(s): Gen Li ; Kai Lu ; Ying Zhang ; Xicheng Lu ; Wei Zhang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Seoul, Korea, Korea (South)
Conference Date: 24 November 2009
Page(s): 1,041 - 1,046
ISBN (CD): 978-0-7695-3896-9
ISBN (Paper): 978-1-4244-5244-6
DOI: 10.1109/ICCIT.2009.118
Regular:

Dynamic test generation approach is becoming increasingly popular to find security vulnerabilities in software. More and more research institutes and organizations use this approach to find... View More

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