IEEE - Institute of Electrical and Electronics Engineers, Inc. - Peeking into Developers' Testing Process

2009 International Conference on Computational Intelligence and Software Engineering

Author(s): Jeppesen, G. ; Kajko-Mattsson, M. ; Murphy, J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2009
Conference Location: Wuhan, China, China
Conference Date: 11 December 2009
Page(s): 1 - 8
ISBN (CD): 978-1-4244-4507-3
DOI: 10.1109/CISE.2009.5366347
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