IEEE - Institute of Electrical and Electronics Engineers, Inc. - On the Relation of Software Architecture Testing Criteria to Generate Test Paths
2009 International Conference on Computational Intelligence and Software Engineering
Author(s): | Lijun Lun ; Hui Xu |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 December 2009 |
Conference Location: | Wuhan, China, China |
Conference Date: | 11 December 2009 |
Page(s): | 1 - 4 |
ISBN (CD): | 978-1-4244-4507-3 |
DOI: | 10.1109/CISE.2009.5365591 |