IEEE - Institute of Electrical and Electronics Engineers, Inc. - Research on a New Real-Time Bad Block Replacement Algorithm

2009 International Conference on Computational Intelligence and Software Engineering

Author(s): Qiu Qinglin ; Zhang Weigong ; Rong Jinye ; Wang Jian
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2009
Conference Location: Wuhan, China, China
Conference Date: 11 December 2009
Page(s): 1 - 3
ISBN (CD): 978-1-4244-4507-3
DOI: 10.1109/CISE.2009.5363372
Advertisement