IEEE - Institute of Electrical and Electronics Engineers, Inc. - The Mean Value Method for Crack Propagation

2009 Fifth International Conference on Natural Computation (ICNC)

Author(s): Tang, X.H. ; Wu, S.C. ; Zheng, C. ; Zhang, J.H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2009
Conference Location: Tianjian, China, China
Conference Date: 14 August 2009
Volume: 6
Page(s): 453 - 457
ISBN (Paper): 978-0-7695-3736-8
DOI: 10.1109/ICNC.2009.73
Regular:

The simulation of crack propagation by mean value method (MVM) is discussed, in which advanced refining and remeshing strategies are proposed and then used. Two benchmark problems are analyzed by... View More

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