IEEE - Institute of Electrical and Electronics Engineers, Inc. - Statistical Performance Modeling and Parametric Yield Estimation of MOS VLSI

Author(s): Tat-Kwan Yu ; Sung Mo Kang ; I.N. Haji ; T.N. Trick
Sponsor(s): IEEE Council on Electronic Design Automation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 1987
Volume: 6
Page(s): 1,013 - 1,022
ISSN (Paper): 0278-0070
ISSN (Online): 1937-4151
DOI: 10.1109/TCAD.1987.1270342
Regular:

A major cost in statistical analysis occurs in repeated system simulation as system parameters are varied. To reduce this cost, the system performances are approximated by regression models in... View More

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