IEEE - Institute of Electrical and Electronics Engineers, Inc. - Optimal Security Patch Release Timing under Non-homogeneous Vulnerability-Discovery Processes

2009 IEEE International Symposium on Software Reliability Engineering (ISSRE)

Author(s): Okamura, H. ; Tokuzane, M. ; Dohi, T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Mysuru, Karnataka, India, India
Conference Date: 16 November 2009
Page(s): 120 - 128
ISBN (CD): 978-0-7695-3878-5
ISBN (Paper): 978-1-4244-5375-7
ISSN (Paper): 1071-9458
DOI: 10.1109/ISSRE.2009.19
Regular:

This paper proposes a patch management model with non-homogeneous vulnerability-discovery processes to find the optimal security patch release times. The proposed model is an extension of... View More

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