IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Complexity Reliability Model

2009 IEEE International Symposium on Software Reliability Engineering (ISSRE)

Author(s): Schneidewind, N. ; Hinchey, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Mysuru, Karnataka, India, India
Conference Date: 16 November 2009
Page(s): 1 - 10
ISBN (CD): 978-0-7695-3878-5
ISBN (Paper): 978-1-4244-5375-7
ISSN (Paper): 1071-9458
DOI: 10.1109/ISSRE.2009.10
Regular:

A model of software complexity and reliability isdeveloped. It uses an evolutionary process to transitionfrom one software system to the next, while complexitymetrics are used to predict the... View More

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