IEEE - Institute of Electrical and Electronics Engineers, Inc. - An Algebraic Criterion of Hopf Bifurcation with Relatively Reliability

2009 International Workshop on Chaos-Fractals Theories and Applications (IWCFTA)

Author(s): Jianjun Tu ; Hanlin He
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Shen Yang, Liao Ning, China, China
Conference Date: 6 November 2009
Page(s): 250 - 254
ISBN (Paper): 978-0-7695-3853-2
DOI: 10.1109/IWCFTA.2009.59
Regular:

The non-dominant characteristic root (NDCR) is defined. The possible damage to Hopf bifurcation caused by the NDCRs is put forward and confirmed by the simulations. The conception of the relative... View More

Advertisement