IEEE - Institute of Electrical and Electronics Engineers, Inc. - Multi-sphere Support Vector Data Description for Outliers Detection on Multi-distribution Data

2009 IEEE International Conference on Data Mining Workshops (ICDMW)

Author(s): Yanshan Xiao ; Bo Liu ; Longbing Cao ; Xindong Wu ; Chengqi Zhang ; Zhifeng Hao ; Fengzhao Yang ; Jie Cao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2009
Conference Location: Miami, FL, USA, USA
Conference Date: 6 December 2009
Page(s): 82 - 87
ISBN (CD): 978-0-7695-3902-7
ISBN (Paper): 978-1-4244-5384-9
DOI: 10.1109/ICDMW.2009.87
Regular:

SVDD has been proved a powerful tool for outlier detection. However, in detecting outliers on multi-distribution data, namely there are distinctive distributions in the data, it is very... View More

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