IEEE - Institute of Electrical and Electronics Engineers, Inc. - Planning of truncated sequential binomial tests via the ASN-increase parameter

2009 IEEE International Conference on Microwaves, Communications, Antennas and Electronics Systems - COMCAS

Author(s): Michlin, Y.H. ; Shaham, O.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2009
Conference Location: Tel Aviv, Israel, Israel
Conference Date: 9 November 2009
Page(s): 1 - 5
ISBN (Paper): 978-1-4244-3985-0
DOI: 10.1109/COMCAS.2009.5386017
Regular:

The Sequential Probability Ratio Test (SPRT) is the most common acceptance test in the field of reliability and quality control of electronic systems. Proposed are measures of the test quality.... View More

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