IEEE - Institute of Electrical and Electronics Engineers, Inc. - Economic design of EWMA control chart using quality cost model based on ARL

2009 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)

Author(s): Yihai He ; Kai Mi ; Wenbing Chang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2009
Conference Location: Hong Kong, China, China
Conference Date: 8 December 2009
Page(s): 945 - 949
ISBN (CD): 978-1-4244-4870-8
ISBN (Paper): 978-1-4244-4869-2
DOI: 10.1109/IEEM.2009.5373539
Regular:

Statistical control charts have been widely used in manufacturing industry. The average Run Length (ARL) is a dominating measure of control chart performance. This paper presents an economic... View More

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