IEEE - Institute of Electrical and Electronics Engineers, Inc. - The statistical performance of double sampling X̃ control charts for correlation data

2009 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)

Author(s): Pei-Hsi Lee ; Chau-Chen Torng ; Huang-Sheng Liao ; Chun-Chieh Tseng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2009
Conference Location: Hong Kong, China, China
Conference Date: 8 December 2009
Page(s): 955 - 959
ISBN (CD): 978-1-4244-4870-8
ISBN (Paper): 978-1-4244-4869-2
DOI: 10.1109/IEEM.2009.5373536
Regular:

Double sampling X̃ control chart (DS) which is a Shewhart-type chart can reduce sample size and detect small process shift fast. In real industries, process observations may be interdependent... View More

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