IEEE - Institute of Electrical and Electronics Engineers, Inc. - Proposed X and S control charts for skewed distributions

2009 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM 2009)

Author(s): M. B. C. Khoo ; A. M. A. Atta ; C-H. Chen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2009
Conference Location: Hong Kong, China
Conference Date: 8 December 2009
Page(s): 389 - 393
ISBN (CD): 978-1-4244-4870-8
ISBN (Paper): 978-1-4244-4869-2
ISSN (Electronic): 2157-362X
ISSN (Paper): 2157-3611
DOI: 10.1109/IEEM.2009.5373327
Regular:

This paper proposes a weighted variance method to compute the limits of the X ¿ and S charts for skewed distributions. The proposed charts extend the weighted variance X ¿ and R charts in by... View More

Advertisement